Supported in part by NSF CPS: Small: Collaborative
Research: Automated and Robust Nano Assembly with Atomic Force Microscopes
(Award # 1035844)
research aims to develop a cyber-physical approach for automating
manipulation of nanoscale particles, tubes, and wires via atomic force
microscopes with the eventual goal of nanoscale device prototyping.
an AFM instrument (Agilent 5500) in our lab
manipulation of latex particles (50nm) to form "IIT NANO CAD"
AFM based nano indentation (Xu,
Yang and Qian 2013)
CNT bending behaviors (Yang and Qian
1. Yang, S. C. and Qian, X.,
"Controlled manipulation of flexible carbon nanotubes through
shape-dependent pushing by atomic force microscopy," Langmuir,
Vol. 29, No. 37, pp. 11793 - 11801, 2013.
2. Xu, K., Yang, S. and Qian, X.,
"Integrating CAD and Nano-Indentation for Complex Lithography",
ASME Journal of Micro and Nano-Manufacturing, Vol. 1, No. 1, pp.
011002, 2013. [pdf]
K., Kalantari, A. and Qian, X., "Efficient AFM based nanoparticle
manipulation via sequential parallel pushing", IEEE Transactions on
Nanotechnology, Vol. 11, No. 4, pp. 666-675, 2012.[pdf]
W., Xu, K., Qian, X. and Wang, R., "Tip based Nano Manipulation
through Successive Directional Push," ASME Journal of Manufacturing
Science and Engineering, Special Issue on Nano Manufacturing, Volume
132, Issue 3, 030909, June 2010.
5 Zhang, D. and Qian, X.,
"Adaptive Scanning in Atomic Force Microscopy" Proceedings of
2009 IEEE Conference on Robotics and Automation (ICRA), Kobe, Japan, May